RAYLASE is simplifying and accelerating the development of laser systems with its new SP-ICE-3 universal control card. It controls 2-axis and 3-axis deflection units as well as all standard laser sources. Furthermore, it offers speed-dependent and position-dependent control for a consistently high processing quality. Its extended marking-and-processing on-the-fly (MOTF) functionality and highly configurable I/Os make it the ideal choice for highly complex laser systems with deflection units.
Material processing using lasers has now become an essential part of many manufacturing processes. This processing includes the engraving of components, perforation of packaging, cutting of cardboard or metal places or the welding of plastics. "Because we develop and offer both components and solutions for laser material processes, we at RAYLASE have the necessary experience to understand exactly what system developers need", explains Berthold Dambacher, Member of the Executive Board of RAYLASE AG. "This is the basis on which we developed the SP-ICE-3 control card, which is so easy to use that it enables fast, easy development of classic laser systems. At the same time, it offers such a wide range of configuration options that even highly complex and specific functions can be implemented using the SP-ICE-3".
The SP-ICE-3 scanhead control card makes beam guidance in the shape of circular arcs, ellipses or text characters easier than ever before. It offers out-of-the-box functions for marking consecutive serial numbers or the current date or time. A new bitmap mode "draws" images with up to 1 MHz pixel frequency and 15 ns resolution. For MOTF applications , two quadrature decoders with differential inputs track the movement of the conveyor belt in the direction of belt travel and in the orthogonal direction. This ensures that the laser job can also be executed correctly on components while they are moving. For detailed diagnosis, system optimisation or monitoring, the SP-ICE-3, controlled by list or control commands, is capable of recording up to 24 million measured values from the various channels that can be selected.